Search Results - Berke, R.B.

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    Speckle Pattern Inversion in High Temperature DIC Measurement

    Speckle Pattern Inversion in High Temperature DIC Measurement by Thai, T.Q., Ruesch, J., Gradl, P.R., Truscott, T.T., Berke, R.B.

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    Importance of Exposure Time on DIC Measurement Uncertainty at Extreme Temperatures

    Importance of Exposure Time on DIC Measurement Uncertainty at Extreme Temperatures by Thai, T.Q., Hansen, R.S., Smith, A.J., Lambros, J., Berke, R.B.

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