Search Results - Banghart, E.K.

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  1. 1
    Extension of the open-circuit voltage decay technique to include plasma-induced bandgap narrowing

    Extension of the open-circuit voltage decay technique to include plasma-induced bandgap narrowing by Banghart, E.K., Gray, J.L.

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  2. 2
    The effect of potential obstacles on charge transfer in image sensors

    The effect of potential obstacles on charge transfer in image sensors by Lavine, J.P., Banghart, E.K.

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  3. 3
    A model for charge transfer in buried-channel charge-coupled devices at low temperature

    A model for charge transfer in buried-channel charge-coupled devices at low temperature by Banghart, E.K., Lavine, J.P., Trabka, E.A., Nelson, E.T., Burkey, B.C.

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