Search Results - Baldischweiler, B.

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  1. 1
    On the determination of noise parameters of low-noise transistor devices

    On the determination of noise parameters of low-noise transistor devices by Seelmann-Eggebert, M., Aja, B., Baldischweiler, B., Moschetti, G., Massler, H., Bruch, D., Schlechtweg, M., Ambacher, O.

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  2. 2
    4-12- and 25-34-GHz Cryogenic mHEMT MMIC Low-Noise Amplifiers

    4-12- and 25-34-GHz Cryogenic mHEMT MMIC Low-Noise Amplifiers by Aja Abelan, Beatriz, Seelmann-Eggebert, M., Bruch, D., Leuther, A., Massler, H., Baldischweiler, B., Schlechtweg, M., Gallego-Puyol, J. D., Lopez-Fernandez, I., Diez-Gonzalez, C., Malo-Gomez, I., Villa, E., Artal, E.

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  3. 3
    Figures of uncertainty for noise measurements

    Figures of uncertainty for noise measurements by Seelmann-Eggebert, M., Baldischweiler, B., Aja, B., Bruch, D., Massler, H.

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