Search Results - Baier, Clertes H. A

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    Documentoscopy by atomic force microscopy (AFM) coupled with Raman microspectroscopy: applications in banknote and driver license analyses

    Documentoscopy by atomic force microscopy (AFM) coupled with Raman microspectroscopy: applications in banknote and driver license analyses by Brandão, Jandira Maria de O. B, Almeida, Natwrie S. M, Dixini, Pedro V. M, Baier, Clertes H. A, Dias, Heloísa P, Bassane, João F. P, França, Hildegardo S, Silva, Samantha R. C, Aquije, Gloria M. F. V, Romão, Wanderson

    Published in Analytical methods
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