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Search Results - BATAILLOU, B
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Buried hydrophobic silicon bonding studied by high-energy x-ray reflectivity
by
Buttard, D
,
Rieutord, F
,
Eymery, J
,
Fournel, F
,
Bataillou, B
Published in
Journal of physics. D, Applied physics
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New layer transfers obtained by the SmartCut process
by
MORICEAU, H
,
FOURNEL, F
,
SOUBIE, A
,
BIASSE, B
,
SOUSBIE, N
,
SARTORI, S
,
MICHAUD, J. F
,
LETERTRE, F
,
RAYSSAC, O
,
CAYREFOURCQ, I
,
RICHTARCH, C
,
DAVAL, N
,
ASPAR, B
,
AULNETTE, C
,
AKATSU, T
,
OSTERNAUD, B
,
GHYSELEN, B
,
MAZURE, C
,
BATAILLOU, B
,
BEAUMONT, A
,
MORALES, C
,
CARTIER, A. M
,
POCAS, S
,
LAGAHE, C
,
JALAGUIER, E
Published in
Journal of electronic materials
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N-contacts degradation analysis of white flip chip LEDs during reliability tests
by
Hamon, B.
,
Bataillou, B.
,
Mendizabal, L.
,
Gasse, A.
,
Feuillet, G.
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Growth and characterisation of self-assembled cubic GaN quantum dots
by
Adelmann, C
,
Martinez Guerrero, E
,
Chabuel, F
,
Simon, J
,
Bataillou, B
,
Mula, G
,
Dang, Le Si
,
Pelekanos, N.T
,
Daudin, B
,
Feuillet, G
,
Mariette, H
Published in
Materials Science and Engineering: B
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Direct inversion of interfacial reflectivity data using the Patterson function
by
Bataillou, Benoît
,
Moriceau, Hubert
,
Rieutord, François
Published in
Journal of applied crystallography
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Self-Assembled GaN Quantum Dots Grown by Plasma-Assisted Molecular Beam Epitaxy
by
Daudin, Bruno
,
Feuillet, Guy
,
Mariette, Henri
,
Mula, Guido
,
Pelekanos, Nikolaos
,
Molva, Engin
,
Rouvière, Jean-Luc
,
Adelmann, Christoph
,
Martinez-Guerrero, Esteban
,
Barjon, Julien
,
Chabuel, Francis
,
Bataillou, Benoit
,
Simon, Julia
Published in
Japanese Journal of Applied Physics
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X-ray characterization of bonding interfaces
by
RIEUTORD, F
,
MORICEAU, H
,
BATAILLOU, B
,
MORALES, C
,
EYINERY, J
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Interest of a short plasma treatment to achieve SI-SIO2-SI bonded structures
by
MORICEAU, H
,
BATAILLOU, B
,
MORALES, C
,
CARTIER, A. M
,
RIEUTORD, F
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Jpn.j.appl.phys ,Part 1. Vol. 40, No. 3B, Pp. 1892-1895. 2001
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