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Search Results - Asanovski, R.
Search Results - Asanovski, R.
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Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
by
Asanovski, R.
,
Arimura, H.
,
de Marneffe, J.-F.
,
Palestri, P.
,
Horiguchi, N.
,
Kaczer, B.
,
Selmi, L.
,
Franco, J.
Published in
IEEE transactions on electron devices
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Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
by
Asanovski, R.
,
Grill, A.
,
Franco, J.
,
Palestri, P.
,
Mertens, H.
,
Ritzenthaler, R.
,
Horiguchi, N.
,
Kaczer, B.
,
Selmi, L.
Published in
Solid-state electronics
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New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
by
Asanovski, R.
,
Grill, A.
,
Franco, J.
,
Palestri, P.
,
Beckers, A.
,
Kaczer, B.
,
Selmi, L.
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Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology
by
Dinh, T. V.
,
Tam, S-W.
,
Scholten, A. J.
,
Tondelli, L.
,
Pijper, R. M. T.
,
Kondapalli, S. H.
,
Xie, J.
,
Wong, A.
,
To, I.
,
Asanovski, R.
,
Selmi, L.
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Gate oxide reliability: upcoming trends, challenges, and opportunities
by
Kaczer, B.
,
Degraeve, R.
,
Franco, J.
,
Grasser, T.
,
Roussel, Ph. J.
,
Bury, E.
,
Weckx, P.
,
Chasin, A.
,
Tyaginov, S.
,
Vandemaele, M.
,
Grill, A.
,
O'Sullivan, B.
,
Fortuny, J. Diaz
,
Canflanca, P. Saraza
,
Waltl, M.
,
Rinaudo, P.
,
Zhao, Y.
,
Kao, E.
,
Asanovski, R.
,
Catapano, E.
,
Beckers, A.
,
Vici, A.
,
Truijen, B.
,
Higashi, Y.
,
Clima, S.
,
Xiang, Y.
,
Sangani, D.
,
Panarella, L.
,
Smets, Q.
,
Knobloch, T.
,
Waldhor, D.
,
Van Troeye, B.
,
Guo, Y.
,
Kruv, A.
,
Viswakarma, K.
,
Gonzalez, M.
,
Linten, D.
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I.e.e.e. Transactions On Electron Devices/Ieee Transactions On Electron Devices
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Ieee Transactions On Electron Devices
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Solid-State Electronics
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Logic Gates
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