Search Results - Anak Tuloi, Charissa Antia

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    Improvement on the Gate Oxide Integrity Caused by the TUB Charges in SOI Technology

    Improvement on the Gate Oxide Integrity Caused by the TUB Charges in SOI Technology by Ying Ying, Lesley Wong, Anak Tuloi, Charissa Antia, Pilkington, Steven John, Hun Jin, Ryan Lee, Zhong Hong, Desmond Lau

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    Conference Proceeding
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