Search Results - Akbal, Madjid

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    Morphology and reliability aspects of 40 nm eSTM™ architecture

    Morphology and reliability aspects of 40 nm eSTM™ architecture by Melul, Franck, Marca, Vincenzo Della, Bocquet, Marc, Akbal, Madjid, Laine, Pierre, Trenteseaux, Frederique, Mantelli, Marc, Hesse, Marjorie, Regnier, Arnaud, Niel, Stephan, La Rosa, Francesco

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    A novel test structure with two active areas for eNVM reliability studies

    A novel test structure with two active areas for eNVM reliability studies by Alkema, Khaled, Melul, Franck, Marca, Vincenzo Della, Bocquet, Marc, Akbal, Madjid, Regnier, Arnaud, Niel, Stephan, La-Rosa, Francesco

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    Accurate Boundary Condition for Short-Channel Effect Compact Modeling in MOS Devices

    Accurate Boundary Condition for Short-Channel Effect Compact Modeling in MOS Devices by Hiblot, Gaspard, Dutta, Tapas, Rafhay, Quentin, Lacord, Joris, Akbal, Madjid, Boeuf, Frederic, Ghibaudo, Gerard

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