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2by McFarland, James M, Ho, Zandra V, Kugener, Guillaume, Dempster, Joshua M, Montgomery, Phillip G, Bryan, Jordan G, Krill-Burger, John M, Green, Thomas M, Vazquez, Francisca, Boehm, Jesse S, Golub, Todd R, Hahn, William C, Root, David E, Tsherniak, AviadGet full text
Published in Nature communications
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6by Ho, Daniel V, Suryajaya, Kaylen G, Manh, Kaitlyn, Duong, Amanda N, Chan, Jefferson YGet full text
Published in Scientific reports
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8by Páez-Moscoso, Diego J, Ho, David V, Pan, Lili, Hildebrand, Katie, Jensen, Kristi L, Levy, Michaella J, Florens, Laurence, Baumann, PeterGet full text
Published in Nature communications
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9by Ghanzouri, I, Amal, S, Ho, V, Safarnejad, L, Cabot, J, Brown-Johnson, C G, Leeper, N, Asch, S, Shah, N H, Ross, E GGet full text
Published in Scientific reports
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10by Petriv, O. I., Kuchenbauer, F., Delaney, A. D., Lecault, V., White, A., Kent, D., Marmolejo, L., Heuser, M., Berg, T., Copley, M., Ruschmann, J., Sekulovic, S., Benz, C., Kuroda, E., Ho, V., Antignano, F., Halim, T., Giambra, V., Krystal, G., Takei, C. J. F., Weng, A. P., Piret, J., Eaves, C., Marra, M. A., Humphries, R. K., Hansen, C. L., Hood, Leroy E.Get full text
Published in Proceedings of the National Academy of Sciences - PNAS
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16by Greiner, Timothy C., Dasgupta, Chiranjib, Ho, Vincent V., Weisenburger, Dennis D., Smith, Lynette M., Lynch, James C., Vose, Julie M., Fu, Kai, Armitage, James O., Braziel, Rita M., Campo, Elias, Delabie, Jan, Gascoyne, Randy D., Jaffe, Elaine S., Muller-Hermelink, Hans K., Ott, German, Rosenwald, Andreas, Staudt, Louis M., Im, Michael Y., Karaman, Mazen W., Pike, Brian L., Chan, Wing C., Hacia, Joseph G.Get full text
Published in Proceedings of the National Academy of Sciences - PNAS
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18by Lau, W.S., Yang, Peizhen, Ho, V., Toh, L.F., Liu, Y., Siah, S.Y., Chan, L.Get full text
Published in Microelectronics and reliability
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20by LAU, W. S, PEIZHEN YANG, JASON ZHIWEI CHIAN, HU, V, LOH, C. H, SIAH, S. Y, CHAN, LGet full text
Published in Microelectronics and reliability
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