-
1
-
2by Fujisawa, Kazunori, Kim, Hee, Go, Su, Muramatsu, Hiroyuki, Hayashi, Takuya, Endo, Morinobu, Hirschmann, Thomas, Dresselhaus, Mildred, Kim, Yoong, Araujo, PauloGet full text
Published in Applied sciences
Article -
3by Lee, Chil Hyoung, Choi, Go Bong, Kim, Eun Mi, Lee, Jongho, Lee, Jaegeun, Moon, Hi Gyu, Kim, Myung Jong, Kim, Yoong Ahm, Seo, Tae HoonGet full text
Published in Applied sciences
Article -
4
-
5
-
6by Jia, Xiaoting, Campos-Delgado, Jessica, Gracia-Espino, Edgar Eduardo, Hofmann, Mario, Muramatsu, Hiroyuki, Kim, Yoong Ahm, Hayashi, Takuya, Endo, Morinobu, Kong, Jing, Terrones, Mauricio, Dresselhaus, Mildred S.Get full text
Published in Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
Article -
7
-
8
-
9
-
10
-
11
-
12by Jung, D.J., Jung, J.Y., Jung, W.W., Lee, E.S., Goh, H.K., Kim, S.Y., Kang, J.Y., Kang, Y.M., Joo, S.H., Lee, S.Y., Jeong, H.S., Hong, Y.K., Kim, Kinam, Kim, H.H., Park, J.H., Kim, H.S., Kang, S.K., Kim, J.H., Ahn, W.S., Choi, D.Y.Request full text
Conference Proceeding -
13
-
14
-
15
-
16by Smets, A.H.M., Petit, A.M.H.N., Nadazdy, V., Kessels, W.M.M., van Swaaij, R.A.C.M.M., van de Sanden, M.C.M.Get full text
Conference Proceeding -
17
-
18
-
19
-
20