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2by Berger, B E, Busenitz, J, Classen, T, Decowski, M P, Dwyer, D A, Elor, G, Frank, A, Freedman, S J, Fujikawa, B K, Galloway, M, Gray, F, Heeger, K M, Hsu, L, Ichimura, K, Kadel, R, Keefer, G, Lendvai, C, McKee, D, O'Donnell, T, Piepke, A, Steiner, H M, Syversrud, D, Wallig, J, Winslow, L A, Ebihara, T, Enomoto, S, Furuno, K, Gando, Y, Ikeda, H, Inoue, K, Kibe, Y, Kishimoto, Y, Koga, M, Minekawa, Y, Mitsui, T, Nakajima, K, Nakamura, K, Owada, K, Shimizu, I, Shimizu, Y, Shirai, J, Suekane, F, Suzuki, A, Tamae, K, Yoshida, S, Kozlov, A, Murayama, H, Grant, C, Leonard, D S, Luk, K -B, Jillings, C, Mauger, C, McKeown, R D, Zhang, C, Lane, C E, Maricic, J, Miletic, T, Batygov, M, Learned, J G, Matsuno, S, Pakvasa, S, Foster, J, Horton-Smith, G A, Tang, A, Dazeley, S, Downum, K E, Gratta, G, Tolich, K, Bugg, W, Efremenko, Y, Kamyshkov, Y, Perevozchikov, O, Karwowski, H J, Markoff, D M, Tornow, W, Piquemal, F, Ricol, J -SGet full text
Published in Journal of instrumentation
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3by Keller, R, Luft, P, Regis, M, Wallig, J, Monroy, M, Ratti, A, Syversrud, D, Welton, R, Anderson, DGet full text
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6by Avery, R., Elioff, T., Grunder, H., Kennedy, K., Meneghetti, J., Aita, R., Barale, J., Batson, P., Bercovitz, J., Caylor, R., Chambers, M., Chin, J., Crebbin, K., Edwards, R., Fong, E., Glicksman, A., Henderson, T., Humphries, D., Hunt, D., Lake, A., Lax, J., Masana, A., MacDonell, F., Mac-Kenzie, R., Morris, D., Nakae, T., Ohmen, D., Richter, R., Rothfuss, D., Ryce, S., Shine, S., Syversrud, D., Voelker, F., White, G., Wilde, S., Wilson, W.Get full text
Published in IEEE transactions on nuclear science
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