-
1
-
2by Blish, R.C., Li, S., Kinoshita, H., Morgan, S., Myers, A.F.Get full text
Published in IEEE transactions on device and materials reliability
Magazinearticle -
3
-
4
-
5by Yang, Yang Richard, Li, X. Steve, Zhang, X. Brian, Lam, Simon S.Get full text
Published in Computer communication review
Magazinearticle -
6
-
7
-
8
-
9
-
10by Williams, C., Mclaughlin, S., Beach, M., Neirynck, D., Nix, A., Chen, K., Morris, K., Kitchener, D., Presser, M., Yuchan LiGet full text
Published in IEEE communications magazine
Magazinearticle -
11
-
12
-
13
-
14
-
15by Yu Jingxing, Yu Jingxing, Pang Jianzhang, Pang Jianzhang, Wang Yizhou, Wang Yizhou, Zheng Dewen, Zheng Dewen, Liu Caicai, Liu Caicai, Wang Weitao, Wang Weitao, Li Youjuan, Li Youjuan, Li Chaopeng, Li Chaopeng, Xiao Lin, Xiao LinGet full text
Published in Geosphere (Boulder, Colo.)
Magazinearticle -
16by Li, Junru, Zhang, Li, Zhang, Kai, Liu, Hongbin, Wang, Meng, Wang, Shiqi, Ma, Siwei, Gao, WenGet full text
Published in IEEE multimedia
Magazinearticle -
17
-
18
-
19by Zhi-li Wu, Chun-hung Li, Ng, J.K.-Y., Leung, K.R.P.H.Get full text
Published in IEEE transactions on mobile computing
Magazinearticle -
20