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1by Ying-Hsin Lu, Ting-Chang Chang, Jih-Chien Liao, Li-Hui Chen, Yu-Shan Lin, Ching-En Chen, Kuan-Ju Liu, Xi-Wen Liu, Chien-Yu Lin, Chen-Hsin Lien, Tseung-Yuen Tseng, Cheng, Osbert, Cheng-Tung Huang, Wei-Ting YenGet full text
Published in IEEE transactions on device and materials reliability
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