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Kim, Yang‐Hoon
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Test Pattern Generators
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Search Results - Kim, Yang‐Hoon
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Kim, Yang‐Hoon
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1
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults
by
Sunghoon Chun
,
Yongjoon Kim
,
Taejin Kim
,
Myung-Hoon Yang
,
Sungho Kang
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2
An Effective Test Pattern Generation for Testing Signal Integrity
by
Yongjoon Kim
,
Myung-Hoon Yang
,
Youngkyu Park
,
DaeYeal Lee
,
Sungho Kang
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3
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture
by
Youbean Kim
,
Myung-Hoon Yang
,
Yong Lee
,
Sungho Kang
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4
An effective parallel ALPG using instruction unrolling for high speed memory testing
by
Hyunjun Yoon
,
Myung-Hoon Yang
,
Yongjoon Kim
,
Youngkyu Park
,
Jaeseok Park
,
Sungho Kang
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Science & Technology
4
Test Pattern Generators
Technology
4
Computer Science
3
Electronic Equipment Testing
3
Computer Science, Hardware & Architecture
2
Engineering, Electrical & Electronic
2
Engineering
2
Circuit Testing
2
Circuit Faults
2
Built-In Self-Test
2
Automatic Test Pattern Generation
2
Algorithm Design And Analysis
1
Alpg
1
Ate
1
Atpg
1
Automatic Testing
1
Benchmark Testing
1
Capacitance
1
Circuit Noise
1
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Ieee Xplore All Conference Series
3
Ieee Electronic Library (Iel) Conference Proceedings
1
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