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Kim, Yang‐Hoon
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Circuit Testing
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Search Results - Kim, Yang‐Hoon
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Kim, Yang‐Hoon
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1
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme
by
Taejin Kim
,
Sunghoon Chun
,
Yongjoon Kim
,
Myung-Hoon Yang
,
Sungho Kang
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2
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults
by
Sunghoon Chun
,
Yongjoon Kim
,
Taejin Kim
,
Myung-Hoon Yang
,
Sungho Kang
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3
Segmented scan architecture using segment grouping for test cost reduction
by
Myung-Hoon Yang
,
Taejin Kim
,
Yongjoon Kim
,
Sungho Kang
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Circuit Testing
Engineering, Electrical & Electronic
3
Science & Technology
3
Technology
3
Engineering
3
Circuit Faults
2
Computer Science
2
Computer Science, Information Systems
2
Electronic Equipment Testing
2
Very Large Scale Integration
2
Combinational Circuits
1
Crosstalk
1
Costs
1
Compaction
1
Atpg
1
Clocks
1
Circuit Noise
1
Broadcasting
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Automatic Test Pattern Generation
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Crosstalk Delay Faults
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Ieee Xplore All Conference Series
2
Ieee Electronic Library (Iel) Conference Proceedings
1
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