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Li, Qing
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Journal Title:
Ieee Transactions On Device And Materials Reliability
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Journal Title:
Ieee Transactions On Device And Materials Reliability
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Magazinearticle
Search Results - Li, Qing
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Li, Qing
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Prediction of NBTI Degradation in Dynamic Voltage Frequency Scaling Operations
by
Li, Xiaojin
,
Qing, Jian
,
Wang, Yanling
,
Sun, Lijie
,
Shi, Yanling
Published in
IEEE transactions on device and materials reliability
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2
Analytical Layout Dependent NBTI Degradation Modeling Based on Non-Uniformly Distributed Interface Traps
by
Li, Xiaojin
,
Qing, Jian
,
Sun, Yabin
,
Shi, Yanling
Published in
IEEE transactions on device and materials reliability
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3
Linear and Resolution Adjusted On-Chip Aging Detection of NBTI Degradation
by
Li, Xiaojin
,
Qing, Jian
,
Sun, Yabin
,
Zeng, Yan
,
Shi, Yanling
,
Wang, Yuheng
Published in
IEEE transactions on device and materials reliability
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Journal Title
Ieee Transactions On Device And Materials Reliability
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Degradation
3
Engineering, Electrical & Electronic
3
Negative Bias Temperature Instability
3
Physical Sciences
3
Physics
3
Physics, Applied
3
Science & Technology
3
Stress
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Technology
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Thermal Variables Control
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Threshold Voltage
2
Aging
2
Logic Gates
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Circuit Design
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Aging Degradation
1
Aging Detecting
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Aging Prediction
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Analytical Model
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Science Citation Index Expanded (Web Of Science)
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Ieee Electronic Library (Iel) Journals
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