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    In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN

    In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN by Yamaguchi, Tomohiro, Sasaki, Takuo, Fujikawa, Seiji, Takahasi, Masamitu, Araki, Tsutomu, Onuma, Takeyoshi, Honda, Tohru, Nanishi, Yasushi

    Published in Crystals (Basel)
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